Chromium and Aluminum films were deposited by evaporation technique in $3{ imes}10^{-6}$ mbar vacuum level at the incident angles ranging from $0^{circ};to;60^{circ}$ with various evaporation rates. We measured the sheet resistances and light transmittances, and observed diffraction patterns by TEM of these films. Relations among diffraction patterns, sheet resistances and light transmittances were discussed. The sheet resistances and light transmittances were shown the lowest values at 25$^{circ}C$ of incident angle for all kinds of evaporation rates.