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Passive Film on Cobalt: A Three-Parameter Ellipsometry Study During the Film Formation
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  • Passive Film on Cobalt: A Three-Parameter Ellipsometry Study During the Film Formation
  • Passive Film on Cobalt: A Three-Parameter Ellipsometry Study During the Film Formation
저자명
Paik. Woon-Kie,Koh. Seunghyun
간행물명
Bulletin of the Korean Chemical Society
권/호정보
1991년|12권 5호|pp.540-544 (5 pages)
발행정보
대한화학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

Thin film being formed on the surface of cobalt in the early stage of electrochemically induced passivation was studied by the three-parameter ellipsometry. The growth of the passive film was complete in a few seconds from the onset of the passivating potential, and was followed by a slight decrease in the thickness in 4-40 seconds. The optical constants of the passive film changed gradually during the changes in the thickness. The thickness and the optical properties at the steady state of passivation depended on the potential of the electrode. From the coulometric data and the optical properties, the composition of the passive films was deduced to be close to those of CoO, ${Co_3}{O_4}$ and ${Co_2}{O_3}$ depending on the potential. Cathodic reduction in the presence of EDTA was found to be an efficient way to obtain film-free reference surface of cobalt.