We consider a Step Life Testing which is deviced for a two-component serial system with the considerably long life time. In the modelling stage we discuss the bivariate exponential distribution suggested by Block and Basu as the bivariate survival function for the two-component system, and develope the cumulative exposure model introduced by Nelson so that it can be used under the bivariate function. We consider inference on the component life time when the components are at work in the system by combining the information from system life test and that from the component tests carried out separately under the controlled environment. In data analysis, maximum likelihood estimators are discussed with the initial value obtained by an weighted least square method. Finally we discuss the optimal time for changing the stress in the simple step stress life testing.