In this paper, we design a pattern generator and a fault position detector to implement the proposed fault test algorithms which are Column Weight Sensitive Fault (CWSF) test algorithm and bit line decoder fault test algorithm for performing the Built-In Self Test(BIST) in RAM. A pattern generator consists of an address generator and a data generator. An address generator is divided into a row address generator for effective address and a column address generator for sequential and parallel addresses. A fault position detector is designed to determine whether full occurred or not and to find the position of the fault. We verify the implemented circuits by the simulation.