We have investigated the effects of deposition angle on magnetic and magneto-optic properties in Co/Pt multilayer thin films. which were prepared bye-beam evaporation on tilted substrates. with varying tilt angle from $0^{circ}$ to $60^{circ}$. The structure of the specimens was examined by x-ray diffractometer and scanning electron microscope. and the magnetic and magneto-optical properties were measured by VSM, torque magnetometer, and Kerr loop tracer. X-ray diffractometry revealed that all of the specimens had multilayer structure and growth orientation of column followed the tangent rule but the crystallograpic orientation, <111>, was slightly deviated from the substrate normal even though the deposition angle was increased up to $60^{circ}$. A decrement of the magnetization and Kerr angle with the deposition angle was related with that of the film density due to increasing porosity. The perpendicular mag¬netic anisotropy was also decreased with increasing the deposition angle.