We have investigated the structure and the conductivity of the $Cd_{1-y}Zn_{y}$ Te films evaporated on the glass substrates (Corning 7059) by Electron Beam Evaporator (EBE) in pressure of approximately $1 { imes} 10^{-6}$ torr.The structure temperatures were held at both room temperature and $300^{circ}C$, and the samples have annealed for an hour at $300^{circ}C$ The survace com-position of the as-prepared films were slightly different from those of CdZn Te source material.Cd losses on the CdZnTe surface was measured about 4% of atomic ratio at room temperature substrate, whereas Zn atomic ratio was nearly constant, relatively. The strure is observed to be polycrystalline whose phase is mainly cubic phase. Thermal expansion coefficient was $6.30 { imes} 10^{-5}/^{circ}C$ which was calculated from the variation of lattice parameter by X-ray powder pat-terns measured at $400^{circ}C$.Diffraction peaks were slightly increased by annealing for an hour at $300^{circ}C $, but they werey highly affected by substrate temperature during evaporation.