This research paper describes several possible suggestions which are essential to develop for Built-In-Test(BIT) related systems, such as more precise BIT parameter analysis, sensitivity analysis of the impact of BIT on redundant systems, statistical inference of field data for BIT performance parameters, methods of reducing BIT false alarms, BIT application in industrial automation and remote control, prevent the system from the impact of BIT failure, undetections and false alarms, life cycle cost analysis for BIT. And, it is mainly focused on redundancy technique for solving BIT diagnostic problems. Algorithms for redundant systems : overlapping technique, flexible redundant BITs are presented and case study will be shown based on various experiment.