We propose an extended additional layer method (EALM) of calculating the coupling coefficient of arbitrary shaped diffraction gratings. In EALM, to determine the unperturbed field distribtution, a grating region is replaced by a new uniform layer whose dielectric constant is the average value of the dielectric constant of a grating region in both longitudinal and transverse directions. Using this method, we calculate the coupling coefficient for a five-layer distributed feedback structure device with trapezoidal and triangular gratings. The validity of this method is established by comparing the results calculated by partitioning the grating region up to five uniform layers.