A study was conducted on the oxidation behavior of U-0.75 wt% Ti chips (Depleted Uranium, DU chips) using an XRD and a thermogravimetric analyzer in the temperature range from 250 to 500$^{circ}C$ in air. At the temperature lower than 400$^{circ}C$, DU chips were converted to UO$_2$, U$_3$O$\_$7/, and U$_3$O$\_$8/ whereas at the temperature higher than 400$^{circ}C$, DU chips were completely converted to U$_3$O$\_$8/, the most stable form of uranium oxide. The activation energy for the oxidation of DU chips is found, 44.9 kJ/mol and the oxidation rate in terms of weight gain (%) can be expressed as; dW/dt8.4${ imes}$10$^2$e(equation omitted) wt%/min (250$leq$T($^{circ}C$) $leq$ 500) where W=weight gain (%), t=time and T=temperature.