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DNA testing for fragile X syndrome in school for severely emotionally handicapped children in Korea
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  • DNA testing for fragile X syndrome in school for severely emotionally handicapped children in Korea
  • DNA testing for fragile X syndrome in school for severely emotionally handicapped children in Korea
저자명
Hong. Sung-Do David,Lee. So-Young,Oh. Myung-Ryurl,Jin. Dong-Kyu
간행물명
Journal of genetic medicine
권/호정보
1998년|2권 2호|pp.83-86 (4 pages)
발행정보
대한의학유전학회
파일정보
정기간행물|ENG|
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기타
이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

Though Fragile X syndrome is one of the most common inherited causes of mental retardation, it is not much detected yet in Korean population. One of the reason may be that the syndrome is not well known to the special education teachers as well as to the clinicians in this country. Thus, molecular test was undertaken to screen out fragile X syndrome in 122 children of two Korean schools for emotionally severely handicapped children. The subjects were all boys, previously known as having pervasive developmental disorder with or without mental retardation. Southern blot analysis of peripheral blood showed the abnormally enlarged (CGG)n repeat sequence associated with fragile X syndrome in two children. This finding suggests that the DNA testing for fragile X syndrome is warranted for Korean high risk population and that more concern about this syndrome is needed for the professionals who work for mentally handicapped children. The issues involved in genetic counseling for fragile X syndrome are discussed.