Testing high reliability devices under nomal operating condition is difficult, because the devices are not likely to fail in the relatively short time available for tests. For most applications it is necessary to accelerate the causes of failure by increasing a stress above its nomal value. Previous accelerated life test(ALT) plans have shown how to find optimum allocation, lowest stress and sample size subject to minimizing the variance of mean life estimator. In these ALT plans, the highest acceptable test-stress was assumed to be specified in advance by the experimenter but there is no guidance for selecting it. This assumption is, however, inappropriate for many applications. Testing devices at too-high stress levels can invalidate the extrapolation model, or introduce failure mechanisms that are not anticipated under nomal operating conditions. In this paper, we propose new 4:2:1 compromise plans using Min-Max method to minimize this risk and present minimized test-stress levels(max, middle, min), and find sample allocation based on Min-Max 4:2:1 compromise plans. In result, we compare previous 4:2:1 compromise plans specified maximum test-stress with Min-Max 4:2:1 compromise plans minimized maximum test-stress.