Even I the Electronic Speckle Pattern Interferometry(ESPI) method that measure the strain of object within wavelength of light is less visibility than Holographic Interferometry(HI) method, the merits of application, convenience and time-save have made the method practical in industry. However, the existing ESPI methods that are based on dual-exposure, real-time and time-average method have difficulties for accurate measurement, due to irregular intensity and shake of phase. Recently, in order to solve this problem, phase shifting method have been proposed. In this method, the path of reference light in interference is shifted to make improvement in distinction and precision. But this method includes too many noise, caused by the problem of relationship between object and phase. Therefore, a method to reduce noise muse be introduced. In this paper, least square fitting method is proposed. As results, the phase-map is influenced by precise phase shifting and current of notes and speckle pattern obtained by phase shifting method is improved on the existing method driven from time-average method.