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Rapid Defect Inspection of Display Device with Optical Spatial Filtering
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  • Rapid Defect Inspection of Display Device with Optical Spatial Filtering
  • Rapid Defect Inspection of Display Device with Optical Spatial Filtering
저자명
Yoon. Dong-Seon,Kim. Seung-Woo
간행물명
International journal of the Korean society of precision engineering
권/호정보
2000년|1권 1호|pp.56-61 (6 pages)
발행정보
한국정밀공학회
파일정보
정기간행물|ENG|
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기타
이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
서지반출

기타언어초록

We present a fast inspection method of machine vision for in-line quality assurance of liquid crystal displays(LCD) and plasma display panels(PDP). The method incorporates an optical spatial filter in the Fourier plane of the imaging optics to block the normal periodic pattern, extracting only defects real time without relying on intensive software image process. Special emphasis is on designing a collimated white light source to provide high degree of spatial coherence for effective real time Fourier transform. At the same time, a low level of temporal coherence is attained to improve defect detection capabilities by avoiding undesirable coherent noises. Experimental results show that the proposed inspection method offers a detection accuracy of 15% tolerance, which is sufficient for industrial applications.