Inorder to accurately measure the high voltage of 22.9[kV] power distribution lines we investigated the temperature dependence of measuring voltage on the number of stack layers in the voltage measurement system made from single and stack voltage divider capacitors (22, 44, 66 layers, respectively). Temperature coefficient of dielectric constant(TC$varepsilon_{{gamma}}$/)of voltage divider capacitors which were fabricated by BaTi $O_3$system ceramics showed the variations from -2.28% to +1.69% in the range of -25[$^{circ}C$] ~50[$^{circ}C$]) was decreased with increasing of stack number and the stack element of 66 layers showed the least error of $pm$0.87%or of $pm$0.87%