In this paper, we analyze the result of the conduced emission and susceptibility tests performed on the KOMPSAT-I ETB Platform. The ETB platform consists of the EM (Engineering Model) boxes developed to perform the electrical functional test. During the conducted emission test, we measured the instant waveform in time domain when each switch was turn on, and spectrum of the noise in the frequency range of 10 Hz up to100 MHz fur the steady state of the ETB. During the conducted susceptibility test, no malfunction and no serious damage of the electronic box were observed when a simulated noise waveform was applied to the DC power bus. The simulated waveform was obtained by adding the 6 dB-system margin to the worst case waveform measured from the conducted emission. This test was performed as co-development of the KOMPSAT-I with TRW in USA.