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Computer Simulation of Switching Characteristics and Magnetization Flop in Magnetic Tunnel Junctions Exchange Biased by Synthetic Antiferromagnets
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  • Computer Simulation of Switching Characteristics and Magnetization Flop in Magnetic Tunnel Junctions Exchange Biased by Synthetic Antiferromagnets
  • Computer Simulation of Switching Characteristics and Magnetization Flop in Magnetic Tunnel Junctions Exchange Biased by Synthetic Antiferromagnets
저자명
Lim. S.H.,Uhm. Y.R.
간행물명
Journal of magnetics
권/호정보
2001년|6권 4호|pp.132-141 (10 pages)
발행정보
한국자기학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

The switching characteristics and the magnetization-flop behavior in magnetic tunnel junctions exchange biased by synthetic antiferromagnets (SyAFs) are investigated by using a computer simulations based on a single-domain multilayer model. The bias field acting on the free layer is found to be sensitive to the thickness of neighboring layers, and the thickness dependence of the bias field is greater at smaller cell dimensions due to larger magnetostatic interactions. The resistance to magnetization flop increases with decreasing cell size due to increased shape anisotropy. When the cell dimensions are small and the synthetic antiferromagnet is weakly, or not pinned, the magnetization directions of the two layers sandwiching the insulating layer are aligned antiparallel due to a strong magnetostatic interaction, resulting in an abnormal magneto resistance (MR) change from the high-MR state to zero, irrespective of the direction of the free-layer switching. The threshold field for magnetization-flop is found to increase linearly with increasing antiferromagnetic exchange coupling in the synthetic antiferromagnet. Irrespective of the magnetic parameters and cell sizes, magnetization flop does not exist near zero applied field, indicating that magnetization flop is driven by the Zeeman energy.