- 품질보증정책하에 ESS와 Burn-in을 결합한 최적비 용모형 의 설정$^{1)}$
- ㆍ 저자명
- 송서일,조영찬,박현규
- ㆍ 간행물명
- 산업경영시스템학회지
- ㆍ 권/호정보
- 2001년|24권 62호|pp.1-10 (10 pages)
- ㆍ 발행정보
- 한국산업경영시스템학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
The electronics industry is fast growing segment of manufacturing and service industries. It is important that the manufacturer develops a product with adequate life cycle, high quality, and low failure rate in the specified time period. Environmental Stress Screening(ESS) and burn-in are widely used in the electronic industry to assist in the elimination of early failure. In this research, we construct optimal cost model of combined ESS and burn-in under various warranty policy and establish optimal testing times for given environments. Also we conduct sensitivity analysis on various parameter. The results of this study are summarized as follows. Comparing free warranty policy to rebate warranty policy, optimal ESS time is longer under free warranty policy, and optimal burn-in time is longer under rebate warranty policy. Free warranty policy higher than rebate warranty policy in total cost.