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Seed Deterioration Response of Different Genes of Sweet Corn during Long-tenn Storage
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  • Seed Deterioration Response of Different Genes of Sweet Corn during Long-tenn Storage
  • Seed Deterioration Response of Different Genes of Sweet Corn during Long-tenn Storage
저자명
Lee. Myoung-Hoon
간행물명
Korean journal of crop science
권/호정보
2001년|46권 4호|pp.317-320 (4 pages)
발행정보
한국작물학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
서지반출

기타언어초록

Sweet com seeds deteriorate faster due to low starch content than field com seeds when stored for a long tenn. This study had been conducted to observe the seed deterioration of four different sweet corns in a long tenn storage conditions in room temperature. Four kinds of sweet com genes (sh2, bt, su, and se) were harvested from 15 days to 50 days after silking with 5-day intervals. These seeds were stored in the room temperature and tested for germination percentages from 3 months to 18 months period with 3-month interval. su seeds germinated better than other types of gene. Hybrid Mecca which is sh2 gene germinated better when stored for 3 months to 18 months. For all genes, mean regression equations in relation to storage periods showed linear responses. For regression equation, the slope of sh2 gene was lower than that of su gene. The highest slope value was observed in bt gene showing faster deterioration rate. The rate at which seed deteriorates seems to be affected by the date at which it was harvested. The seeds that were harvested at the optimum time deteriorated more slowly than those which were not.