- Wavelet Analysis to Real-Time Fabric Defects Detection in Weaving processes
- Wavelet Analysis to Real-Time Fabric Defects Detection in Weaving processes
- ㆍ 저자명
- Kim. Sung-Shin,Bae. Hyeon,Jung. Jae-Ryong,Vachtsevanos. George J.
- ㆍ 간행물명
- International journal of fuzzy logic and intelligent systems
- ㆍ 권/호정보
- 2002년|2권 1호|pp.89-93 (5 pages)
- ㆍ 발행정보
- 한국지능시스템학회
- ㆍ 파일정보
- 정기간행물|ENG| PDF텍스트
- ㆍ 주제분야
- 기타
