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Thermally Assisted Carrier Transfer and Field-induced Tunneling in a Mg-doped GaN Thin Film
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  • Thermally Assisted Carrier Transfer and Field-induced Tunneling in a Mg-doped GaN Thin Film
  • Thermally Assisted Carrier Transfer and Field-induced Tunneling in a Mg-doped GaN Thin Film
저자명
정상근,김윤겸,신현길,Chung. Sang-Geun,Kim. Yoon-Kyeom,Shin. Hyun-Gil
간행물명
한국재료학회지
권/호정보
2002년|12권 6호|pp.431-435 (5 pages)
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한국재료학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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The dark current and photocurrent(PC) spectrum of Mg-doped GaN thin film were investigated with various bias voltages and temperatures. At high temperature and small bias, the dark current is dominated by holes thermally activated from an acceptor level Al located at about 0.16 eV above the valence band maximum $(E_v)$, The PC peak originates from the electron transition from deep level A2 located at about 0.34 eV above the $E_v$ to the conduction band minimum $(E_ C)$. However, at a large bias voltage, holes thermally activated from A2 to Al experience the field-in-duces tunneling to form one-dimensional defect band at Al, which determines the dark current. The PC peak associated with the transition from Al to $E_ C$ is also observed at large bias voltages owing to the extended recombination lifetime of holes by the tunneling. In the near infrared region, a strong PC peak at 1.20 eV appears due to the hole transition from deep donor/acceptor level to the valence band.