Influences of bending strain on the critical current (Ic) were investigated in Bi-2223 superconducting tapes at 77K. The effect of bending mode on the Ic degradation behavior was discussed in viewpoints of test procedure, n-value and damage morphology Especially, in this paper, we reported the Ic behavior in Ag alloy/Bi-2223 multifilamentary superconducting tapes under bending occurred within a width plane of the tape which was called as a hard bending. The Ic degradation under hard bending appeared significantly as compared with that under easy bending. The n-value decreased slightly with the increase in bending strain under the hard bending.