- $Nb/A1O_x/Nb$ 조셉슨 접합에서 저항측정을 이용한 Nb 전극의 침투깊이 측정
- ㆍ 저자명
- 김동호,김규태,박종원,황준석,홍현권
- ㆍ 간행물명
- 한국초전도·저온공학회논문지
- ㆍ 권/호정보
- 2002년|4권 1호|pp.50-54 (5 pages)
- ㆍ 발행정보
- 한국초전도저온공학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
Penetration depth of Nb electrodes in $Nb/A1O_x/Nb$ Josephson junctions has been measured by resistive method. For a given applied field, the total flux through the junction is temperature dependent because the penetration depth of Nb electrode varies with temperature. If the total flux equals an integral multiple of the flux quantum at certain temperatures, resistive peaks appear at those temperatures. The penetration depth of Nb can be determined by applying the above condition, The temperature dependence of penetration depth was found to be well described by the two-fluid model.