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The Elimination Characteristics by Impressed Voltage of Holography Grating in Chacogenide Thin Film
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  • The Elimination Characteristics by Impressed Voltage of Holography Grating in Chacogenide Thin Film
  • The Elimination Characteristics by Impressed Voltage of Holography Grating in Chacogenide Thin Film
저자명
Lee. Ki-Nam,Yeo. Cheol-Ho,Yang. Sung-Jun,Chung. Hong-Bay
간행물명
Transactions on electrical and electronic materials
권/호정보
2004년|5권 6호|pp.219-222 (4 pages)
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한국전기전자재료학회
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정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

This paper discovers that there are some peculiar properties that can remove holography grating, which was made in chacogenide thin film by impressed voltage. The thin films were used are $As_{40}Ge_{10}Se_{15}S_{35}$, and we use He-Ne laser in order to form thin films. I-V curved line in a thin film before a lattice was made has the critical point, about 3.7 V. Moreover, the I-V curved line increased current intensity at over 4 V after it made thin film. In addition, while holography grating is being made, and when it has the highest diffraction efficiency, a lattice can be deleted if put more voltage into it.