- Sampling Inspection Plans for Defect
- Sampling Inspection Plans for Defect
- ㆍ 저자명
- Jeong. Jeong-Im,Cho. Gyo-Young
- ㆍ 간행물명
- 한국데이터정보과학회지
- ㆍ 권/호정보
- 2004년|15권 4호|pp.867-877 (11 pages)
- ㆍ 발행정보
- 한국데이터정보과학회
- ㆍ 파일정보
- 정기간행물|ENG| PDF텍스트
- ㆍ 주제분야
- 기타
The sequential sampling inspection method is an extension of the multiple-sampling methods, and its theory is based on the sequential probability ratio test (SPRT) of Wald. In this paper, the characteristics of SPRT for testing the number of defects are approximated by using the estimated excess over the boundaries. The use of the estimated excess shows good performances in estimating the operating characteristic function and the average sample number of SPRT compared to the method by neglecting the excess. It also makes it possible to determine the boundary values which satisfy the desired error probabilities.