- Measurement of Sub-micrometer Features Based on The Topographic Contrast Using Reflection Confocal Microscopy
- Measurement of Sub-micrometer Features Based on The Topographic Contrast Using Reflection Confocal Microscopy
- ㆍ 저자명
- Lee. SeungWoo,Kang. DongKyun,Yoo. HongKi,Kim. TaeJoong,Gweon. Dae-Gab,Lee. Suk-Won,Kim. Kwang-Soo
- ㆍ 간행물명
- Journal of the Optical Society of Korea
- ㆍ 권/호정보
- 2005년|9권 1호|pp.26-31 (6 pages)
- ㆍ 발행정보
- 한국광학회
- ㆍ 파일정보
- 정기간행물|ENG| PDF텍스트
- ㆍ 주제분야
- 기타
