We demonstrate that high-resolution (~60 nm) near-field fluorescence images of fluorescent nanospheres can be obtained by utilizing the tip-induced fluorescence quenching process. A time-stamped photon counting (TSPC) technique employed enables us to efficiently measure the degree of fluorescence quenching caused by the dielectric or metallic atomic force microscopy tip. We find that the degree of quenching is not only determined by the tip-material but also by the local morphology of the tip. The fringe patterns around individual nanospheres observed are explained in terms of the interference between the excitation field that is directly induced by the laser source, and the scattered excitation field from the tip.