We present an ultrahigh-resolution full-field optical coherence tomography (FF-OCT) implemented with a white-light interference microscope and a detector array as an alternative OCT technique. The use of detector array allows the capture of two-dimensional en-face images in parallel without taking any lateral scanning process. The phase shifting interferometric technique with the sinusoidal phase modulation (SPM) is utilized to get the demodulated OCT images. The configuration of the system and the resolution of the obtained image are presented. The topographic images, taken with the implemented system, of a coin, an integrated circuit chip, and the tomographic images of an onion epithelium are demonstrated also. Axial and lateral spatial resolution of ${sim}1.0{mu}m$ and ${sim}2.0{mu}m$ are achieved with the system respectively.