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Analysis of Magnetic Field Application Effect on Fault Current Limiting Characteristics of a Flux-lock Type SFCL
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  • Analysis of Magnetic Field Application Effect on Fault Current Limiting Characteristics of a Flux-lock Type SFCL
  • Analysis of Magnetic Field Application Effect on Fault Current Limiting Characteristics of a Flux-lock Type SFCL
저자명
Lim. Sung-Hun
간행물명
Transactions on electrical and electronic materials
권/호정보
2008년|9권 6호|pp.255-259 (5 pages)
발행정보
한국전기전자재료학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

The magnetic field application effect on resistance of a high-$T_c$ superconducting (HTSC) element comprising a flux-lock type superconducting fault current limiter (SFCL) was investigated. The YBCO thin film, which was etched into a meander line using a lithography, was used as a current limiting element of the flux-lock type SFCL. To increase the magnetic field applied into HTSC element, the capacitor was connected in series with a solenoid-type magnetic field coil installed in the third winding of the flux-lock type SFCL. There was no magnetic field application effect on the resistance of HTSC element despite the application of larger magnetic field into the HTSC element when a fault happened. The resistance of HTSC element, on the contrary, started to decrease at the point of four periods from a fault instant although the amplitude of the applied magnetic field increased.