- 증착온도 변화에 따른 화학증착 ZrC의 미세구조와 경도 변화
- ㆍ 저자명
- 박종훈,정충환,김원주,김도진,박지연,Park. Jong-Hoon,Jung. Choong-Hwan,Kim. Weon-Ju,Kim. Do-Jin,Park. Ji-Yeon
- ㆍ 간행물명
- 한국세라믹학회지
- ㆍ 권/호정보
- 2008년|45권 9호|pp.567-571 (5 pages)
- ㆍ 발행정보
- 한국세라믹학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
The properties of a grown film by the chemical vapor deposition process depend on the deposition temperature because the deposition mechanism of the CVD film is controlled by the deposition temperature. The preferred orientation of the zrC film changed from (111) to (220) or (200) with an increase of the deposition temperature. The grain size of the ZrC film changes from $0.8{mu}m$ to $2.5{mu}m$ in the range of 1350 to $1500^{circ}C$. The hardness of the deposited ZrC film depended on the preferred orientation and the grain size. The hardness of the ZrC film deposited at $1400^{circ}C$ was 31 GPa.