This paper demonstrates the validity of spectral element analysis for modeling the high-frequency dynamic behaviors of a beam with a surface-bonded piezoelectric wafer through a laboratory test. In the spectral element analysis, the high-frequency electro-mechanical interaction can be considered properly with relatively low computational cost compared to the finite element analysis. In the verification test, a cantilever beam with a surface-bonded piezoelectric wafer is forced to be in steady-state motion by exerting the harmonic driving voltage signal on the piezoelectric wafer. A laser scanning vibrometer is used to obtain the overall dynamic responses of the structure such as resonance frequencies, the associated mode shapes, and frequency response functions up to 20 kHz. Then, these dynamic responses from the test are compared to those computed by the spectral element analysis. A two-dimensional finite analysis is conducted to obtain the asymptotic solutions for the comparison purpose as well.