The study presents two measurement split-plot models with a restricted randomization to save cost and time. Split-plot models are used to handle HTCM (Hard To Control Measurement) factors such as high temperature and long-time catalyst control. The models developed are represented by the processes for estimating the measurement precisions, that is, gauge R&R. The study also introduces three-step procedures to indentify resolution, improve R&R reduction, and evaluate the precision effect.