고다층 배선 기판에 형성된 개방 스터브(open stub)를 제거한 후면드릴가공홀(Back-Drilled-Hole, BDH)과 일반적인 구조인 관통홀(Plated-Through-Hole, PTH) 구조의 전기적 특성에 대한 분석을 하였으며, 고속 선호를 부품 실장면으로부터 내층의 스트립라인으로 전송하기 위해 비아홀의 급전 길이가 가장 긴 전송층을 선택하였다. 10 GHz의 광대역 주파수 내에서 실험계획법(DOE, design of experiment)을 적용하여 비아홀 구조 내에 외층과 급전층 사이의 비아홀의 길이, 접지층에 형성된 천공(anti-pad)의 크기와 급전층에 형성된 패드 (pad)의 크기가 최대 반사 손실 반전력 주파수와 삽입 손실에 미치는 영향을 분석하였다. 이로 부터 거시적 모델(macro model)을 위한 회귀 실험식을 추출하여 실험 결과와 비교 평가하였고, 실험 영역 외에서도 측정 결과와 5% 이내의 오차를 보이고 있음을 확인하였다.
The electrical properties of a back drilled via-hole (BDH) without the open-stub and the plated through via-hole (PTH) with the open-stub, which is called the conventional structure, in a high-count multi~layered (HCML) printed circuit board (PCB) were investigated for a high-speed digital system, and a selected inner layer to transmit a high-speed signal was farthest away from the side to mount the component. Within 10 GHz of the broadband frequency, a design of experiment (DOE) methodology was carried out with three cause factors of each via-hole structure, which were the distance between the via-holes, the dimensions of drilling pad and the anti-pad in the ground plane, and then the relation between cause and result factors which were the maximum return loss, the half-power frequency, and the minimum insertion loss was analyzed. Subsequently, the empirical formulae resulting in a macro model were extracted and compared with the experiment results. Even, out of the cause range, the calculated results obtained from the macro model can be also matched with the measured results within 5 % of the error.
