Most research about patent data analyzes the trend of technologies using a Patent Map(PM), and suggests the frequencies and trend of patents in a certain topic using tables or graphs in Excel. However, more advanced analysis tools are recently needed to compare the trends among national and international industries. This research discussed why statistical analysis is needed to improve the reliability in PM analysis, and the research compares the trends of patents in Korea between 1990 and 2004 by years, International Patent Classification(IPC) sections, and countries using the frequencies and Poisson regression model. The statistical analysis is also suggested and applied to R&D studies.