In this paper, a new loopback BIST structure which is effective to test RF transceiver chip and LNA(Low Noise Amplifier) in the chip is presented. Because the presented BIST structure uses a baseband processor in the chip as a tester while the system is under testing mode, the developed test technique has an advantage of performing test application and test evaluation in effectiveness. The presented BIST structure can change high frequency test output signals to a low frequency signals which can make the CUT(circuits under test) tested easily. By using this technique, the necessity of RF test equipment can be mostly reduced. The test time and test cost of RF circuits can be cut down by using proposed BIST structure, and finally the total chip manufacturing costs can be reduced.