In this paper, the effect of back tension in multi-pass drawing or wiredrawing on the central bursting defect is investigated using finite element predictions. A rigid-plastic finite element method was used together with the McClintock damage model. Central bursting defects under different back tension stress values ranging from 0% to 20% of the yield strength of the material were predicted and they were compared to understand the effect of the back tension stress values on the central bursting defect. It is found that the level of back tension has a strong influence on the cumulative damage. Thus, higher back tension raises the possibility of the central bursting defect occurring, even though it decreases the interfacial pressure between the die and the work piece.