- Analytical Eye-Diagram Determination for the Efficient and Accurate Signal Integrity Verification of Coupled Interconnect Lines
- Analytical Eye-Diagram Determination for the Efficient and Accurate Signal Integrity Verification of Coupled Interconnect Lines
- ㆍ 저자명
- Lee. Minji,Kim. Dongchul,Eo. Yungseon
- ㆍ 간행물명
- Journal of semiconductor technology and science
- ㆍ 권/호정보
- 2013년|13권 6호|pp.594-607 (14 pages)
- ㆍ 발행정보
- 대한전자공학회
- ㆍ 파일정보
- 정기간행물|ENG| PDF텍스트
- ㆍ 주제분야
- 기타
