- 유연성 소자용 금속 전극의 신뢰성 연구 동향
- Reliability of Metal Electrode for Flexible Electronics
- ㆍ 저자명
- 김병준,Kim. Byoung-Joon
- ㆍ 간행물명
- 마이크로전자 및 패키징 학회지
- ㆍ 권/호정보
- 2013년|20권 4호|pp.1-6 (6 pages)
- ㆍ 발행정보
- 한국마이크로전자및패키징학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
Recently, various types of flexible devices such as flexible displays, batteries, e-skins and solar cell panels have been reported. Most of the researches focus on the development of high performance flexible device. However, to realize these flexible devices, the long-term reliability should be guaranteed during the repeated deformations of flexible devices because the direct mechanical stress would be applied on the electronic devices unlike the rigid Si-based devices. Among various materials consisting electronics devices, metal electrode is one of the weakest parts against mechanical deformation because the mechanical and electrical properties of metal films degrade gradually due to fatigue damage during repeated deformations. This article reviews the researches of fatigue behavior of thin metal film, and introduces the methods to enhance the reliability of metal electrode for flexible device.