Recently, studies about process mining for creating and analyzing business process models from log data have received much attention from BPM (Business Process Management) researchers. Process mining is a kind of method that extracts meaningful information and hidden rules from the event log of enterprise information systems such as ERP and BPM. In this paper, repair processes of electronic devices are analyzed using ProM which is a process mining tool. And based on the analysis of repair processes, the method for finding major failure patterns is proposed by multi-dimensional data analysis beyond simple statistics. By using the proposed method, the reliability of electronic device can be increased by providing the identified failure patterns to design team.