- 전해 Cu Via-Filling 도금에서 염소이온이 가속제와 억제제에 미치는 영향
- ㆍ 저자명
- 유현철,조진기,Yu. Hyun-Chul,Cho. Jin-Ki
- ㆍ 간행물명
- 한국표면공학회지
- ㆍ 권/호정보
- 2013년|46권 4호|pp.158-161 (4 pages)
- ㆍ 발행정보
- 한국표면공학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
Recently, the weight reduction and miniaturization of the electronics have placed great emphasis. The miniaturization of PCB (Printed Circuit Board) as main component among the electronic components has also become progressed. The use of acid copper plating process for Via-Filling effectively forms interlayer connection in build-up PCBs with high-density interconnections. However, in the case of copper-via filled in a bath, which is greatly dependent on the effects of additives. This paper discusses effects of Cl ion on the filling of PCB vias with electrodeposited copper based on both electrochemical experiment and practical observation of cross sections of vias.