- 태양광 발전시스템의 신뢰성 향상을 위한 태양전지의 PID 저감 기술의 타당성 검토
- ㆍ 저자명
- 백성선,백승엽,정태욱,조진형,Baik. Sungsun,Baek. Seungyup,Jung. Tae-Wook,Cho. Jin-Hyng
- ㆍ 간행물명
- 산업경영시스템학회지
- ㆍ 권/호정보
- 2013년|36권 2호|pp.32-38 (7 pages)
- ㆍ 발행정보
- 한국산업경영시스템학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
In recent years, anti-PID (Potential Induced Degradation) technologies have been studied and developed at various stages throughout the solar value chain from solar cells to systems in an effort to enhance long-term reliability of the photovoltaics (PV) system. Such technologies and applications must bring in profits economically for both manufacturers of solar cell/module and investors of PV systems, simultaneously for the development of the PV industry. In this study two selected anti-PID technologies, ES (modification of emitter structure) and ARC (modification of anti-reflective coating) were compared based on the economic features of both a cell maker with 60MW production capacity and an investor of 1MW PV power plant. As a result of this study, it is shown that ARC anti-PID technology can ensure more profits over ES technology for both the cell manufacturer and the investor of PV power plant.