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Automatic Detection Method for Mura Defects on Display Films Using Morphological Image Processing and Labeling
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  • Automatic Detection Method for Mura Defects on Display Films Using Morphological Image Processing and Labeling
  • Automatic Detection Method for Mura Defects on Display Films Using Morphological Image Processing and Labeling
저자명
Cho. Sung-Je,Lee. Seung-Ho
간행물명
전기전자학회논문지
권/호정보
2014년|18권 2호|pp.234-239 (6 pages)
발행정보
한국전기전자학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

This paper proposes a new automatic detection method to inspect mura defects on display film surface using morphological image processing and labeling. This automatic detection method for mura defects on display films comprises 3 phases of preprocessing with morphological image processing, Gabor filtering, and labeling. Since distorted results could be obtained with the presence of non-uniform illumination, preprocessing step reduces illumination components using morphological image processing. In Gabor filtering, mura images are created with binary coded mura components using Gabor filters. Subsequently, labeling is a final phase of finding the mura defect area using the difference between large mura defects and values in the periphery. To evaluate the accuracy of the proposed detection method, detection rate was assessed by applying the method in 200 display film samples. As a result, the detection rate was high at about 95.5%. Moreover, the study was able to acquire reliable results using the Semu index for luminance mura in image quality inspection.