- 차량의 헤드램프 빔 패턴 인식을 위한 헤드램프 검사 시스템 개발
- ㆍ 저자명
- 김정훈,조지운,Kim. Junghoon,Cho. Chiwoon
- ㆍ 간행물명
- 한국자동차공학회논문집
- ㆍ 권/호정보
- 2014년|22권 7호|pp.23-30 (8 pages)
- ㆍ 발행정보
- 한국자동차공학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
"Cut off line" in automotive passing beam has very important safety function because it serves for headlamp aiming. Headlights that are aimed incorrectly will not only perform poorly but also offend oncoming traffic. In addition, an objective definition of cut off line in low beam is necessary, since a requirement for correct aiming of the beams is specified within all the existing regulations. Accordingly, headlight regulations are requirements that automobiles must satisfy in order to be sold in a particular country. In this study, a more advanced recognition method for the cut off lines of the various headlamps commonly used in Europe, North America, and domestic is suggested and a headlamp testing system is developed to adjust the beam to the country-specific regulation. This system uses image processing technology to detect the cut off lines in the beam patterns of halogen headlamps, high-intensity discharge headlamps, and light-emitting diode headlamps as well.