- 졸-겔법에 의한 $(Pb_{0.9}Ca_{0.1})TiO_3$ 박막의 강유전 특성
- ㆍ 저자명
- 김행구,정수태,이종헌,Kim. Haeng-Koo,Chung. Su-Tae,Lee. Jong-Hyun
- ㆍ 간행물명
- 전기전자재료학회논문지
- ㆍ 권/호정보
- 1998년|11권 2호|pp.138-145 (8 pages)
- ㆍ 발행정보
- 한국전기전자재료학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
The $(Pb_{0.9}Ca_{0.1})TiO_3$[PCT] thin films have been deposited by sol-gel processing on Si-wafer and ITO glass substrates. The creak-free films have been obtained by rapid thermal annealing at $700^{circ}C$ for 10 minute and characterized by XRD, SEM and electrical measurements. Their tetragonality c/a was 1.041 and grain size was $0.15{sim}0.2{mu}m$. When the electrode system of sample was Au/PCT/ITO(MFM) and film thickness was $0.8{mu}m$, dielectric constant, dielectric loss and Curie temperature were about 149, 0.085 and $449^{circ}C$ at 10kHz, respectively. Spontaneous polarization $P_s$, remnant polarization $P_r$ and coercive field $E_c$ were about $5.29{mu}C/cm^2$, $4.15{mu}C/cm^2$ and 82kV/cm calculated by hysteresis loop.