Complex Products may present more than one type of defects and these defects are not always of equal severity. These defects are classified according to their seriousness and effect on product quality and performance. Demerit systems are very effective systems to monitoring the different types of defects. So, classical demerit control chart used to monitor counts of several different types of defects simultaneously in complex products. S.M. Na et al.(2003) proposed the Demerit-CUSUM for the improvement of the demerit control chart performance and Nembhard, D. A. et al.(2001) and G.Y Cho et al.(2004) developed a Demerit control chart using the EWMA technique and evaluated the performance of the control chart. In this paper, we present an effective method for process control using the Demerit-CUSUM with fast initial response. Moreover, we evaluate exact performance of the Demerit-CUSUM control chart with fast initial response, Demerit-CUSUM and Demerit-EWMA according to changing sample size or parameters.