Process capability indices have been widely used in manufacturing industries to provide a quantitative measure of process performance. PCIs have been developed to represent process capability more exactly. In the previous studies, only one designated location on each part has been measured. But multiple measurement locations on each part are required to calculate the reliable process capability. In this paper, we propose a new process capability index dealing the multiple measurement locations on each part. Also we showed the relationship between the new index and sigma level according to the number of measurement locations.