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A 10-b 500 MS/s CMOS Folding A/D Converter with a Hybrid Calibration and a Novel Digital Error Correction Logic
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  • A 10-b 500 MS/s CMOS Folding A/D Converter with a Hybrid Calibration and a Novel Digital Error Correction Logic
  • A 10-b 500 MS/s CMOS Folding A/D Converter with a Hybrid Calibration and a Novel Digital Error Correction Logic
저자명
Jun. Joong-Won,Kim. Dae-Yun,Song. Min-Kyu
간행물명
Journal of semiconductor technology and science
권/호정보
2012년|12권 1호|pp.1-9 (9 pages)
발행정보
대한전자공학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

A 10-b 500 MS/s A/D converter (ADC) with a hybrid calibration and error correction logic is described. The ADC employs a single-channel cascaded folding-interpolating architecture whose folding rate (FR) is 25 and interpolation rate (IR) is 8. To overcome the disadvantage of an offset error, we propose a hybrid self-calibration circuit at the open-loop amplifier. Further, a novel prevision digital error correction logic (DCL) for the folding ADC is also proposed. The ADC prototype using a 130 nm 1P6M CMOS has a DNL of ${pm}0.8$ LSB and an INL of ${pm}1.0$ LSB. The measured SNDR is 52.34-dB and SFDR is 62.04-dBc when the input frequency is 78.15 MHz at 500 MS/s conversion rate. The SNDR of the ADC is 7-dB higher than the same circuit without the proposed calibration. The effective chip area is $1.55mm^2$, and the power dissipates 300 mW including peripheral circuits, at a 1.2/1.5 V power supply.