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Issues with the electrical characterization of graphene devices
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  • Issues with the electrical characterization of graphene devices
저자명
Byoung Hun Lee, Young Gon Lee, Uk Jin Jung, Yong Hun Kim, Hyeon Jun Hwang, Jin Ju Kim ,Chang Goo Kan
간행물명
Carbon LettersKCI
권/호정보
2012년|13권 1호(통권47호)|pp.23-28 (6 pages)
발행정보
한국탄소학회|한국
파일정보
정기간행물|ENG|
PDF텍스트(0.61MB)
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기타언어초록

Graphene is an attractive material for device applications, but device characteristics are very unstable because the graphene is very sensitive to environmental factors such as charges nearby the graphene, metal contacts, defects, contaminants and other adsorbates. Since the interactions between graphene and environmental factors affect the electrical characteristics of graphene devices, the interpretation of electrical characteristics as simple as current-voltage curves is non-trivial, despite the common practice of using well known electrical characterization methods that have been used in silicon MOSFET. This paper addresses major obstacles in the electrical characterization of graphene devices and offers countermeasures to improve the accuracy of electrical characterization methods.

목차

1. Introduction
2. Silicon Devices Versus Graphene Devices
3. Device Structures
4. Hysteretic Device Characteristics
5. Analysis of Current Voltage Characteristics
6. Countermeasures
7. Conclusions
Acknowledgements
References

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